Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

Kim, Gyu-Tae

doi:10.1038/s41699-020-00186-w

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NPJ 2D MATERIALS AND APPLICATIONS

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197 since deposited on 2022-02-23

Acq. date: 2025-10-23

1979 since deposited on 2022-02-23

Acq. date: 2025-10-23

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

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