Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Characterization of thin silicon films grown in a batch-type LP-CVD system
Publication:
Characterization of thin silicon films grown in a batch-type LP-CVD system
Date
2005
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Nieuwenhuysen, Kris
;
Van Gestel, Dries
;
Kuzma Filipek, Izabela
;
Duerinckx, Filip
;
Beaucarne, Guy
;
Poortmans, Jef
Journal
Abstract
Description
Metrics
Views
1902
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1902
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations