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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
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2049 since deposited on 2021-10-25
3last month
Acq. date: 2025-12-10
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Views
2049 since deposited on 2021-10-25
3last month
Acq. date: 2025-12-10
Citations