Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Detection of metallic contaminants on silicon by surface sensitive minority carrier lifetime measurements
Publication:
Detection of metallic contaminants on silicon by surface sensitive minority carrier lifetime measurements
Date
1998
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Norga, Gerd
;
Platero, M.
;
Black, K. A.
;
Reddy, A. J.
;
Michel, J.
;
Kimerling, L. C.
Journal
J. Electrochem. Soc.
Abstract
Description
Metrics
Views
1929
since deposited on 2021-10-01
456
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1929
since deposited on 2021-10-01
456
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations