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Understanding the effect of confinement in scanning spreading resistance microscopy measurements
Publication:
Understanding the effect of confinement in scanning spreading resistance microscopy measurements
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Date
2020
Journal article
https://doi.org/10.1063/5.0011703
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Understanding_the_effect_of_confinement_in_scanning_spreading_resistance_microscopy_measurements
1.98 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pandey, Komal
;
Paredis, Kristof
;
Robson, Alexander
;
Vandervorst, Wilfried
Journal
Journal of Applied Physics
Abstract
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1909
since deposited on 2021-10-29
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Metrics
Downloads
223
since deposited on 2021-10-29
6
last month
3
last week
Acq. date: 2026-01-12
Views
1909
since deposited on 2021-10-29
Acq. date: 2026-01-12
Citations