Flip-chip-integrated silicon nitride ECL at 640nm with relaxed alignment tolerances

Simple item page Full metadata Statistics

Author(s)

;

Schulten, Michael

;

Mashayekh, Alireza Tabatabaei

;

Rodrigo, Rebecca

;

Ackermann, Manuel

;

Ghannam, Ibrahim

;

;

Merget, Florian

;

Leisching, Patrick

;

Witzens, Jeremy

Journal

Proceedings of SPIE

Metrics

1234 since deposited on 2022-08-14

Acq. date: 2025-10-26