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In situ analysis of nucleation reactions during TiCl4/H2O atomic layer deposition on SiO2 and H-terminated Si surfaces treated with a silane small molecule inhibitor
Publication:
In situ analysis of nucleation reactions during TiCl4/H2O atomic layer deposition on SiO2 and H-terminated Si surfaces treated with a silane small molecule inhibitor
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Date
2023
Journal article
https://doi.org/10.1116/6.0002493
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2.97 MB
Accepted version
3.49 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Clerix, Jan-Willem
;
Dianat, Golnaz
;
Delabie, Annelies
;
Parsons, Gregory N.
Journal
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
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Metrics
Downloads
353
since deposited on 2023-05-05
65
last month
11
last week
Acq. date: 2025-12-15
Views
988
since deposited on 2023-05-05
2
last month
Acq. date: 2025-12-15
Citations