Publication:
Vertical localization of trapped holes in SiON pMOSFETs after positive and negative gate stress
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1835 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-10
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Views
1835 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-10
Citations