Publication:

A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications

Date

2021
Journal article
https://doi.org/10.3390/electronics10192384
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Published version 2.69 MB

Author(s)

Rao, Siddharth  
;
Couet, Sebastien  
;
Van Beek, Simon  
;
Kundu, Shreya  
;
Houshmand Sharifi, Shamin  
;
Jossart, Nico  
;
Kar, Gouri Sankar  

Journal

ELECTRONICS

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347 since deposited on 2021-11-02
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1792 since deposited on 2021-11-02
1last month
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Acq. date: 2026-07-17

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