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Articles
A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications
Publication:
A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications
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Date
2021
Journal article
https://doi.org/10.3390/electronics10192384
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2.69 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rao, Siddharth
;
Couet, Sebastien
;
Van Beek, Simon
;
Kundu, Shreya
;
Houshmand Sharifi, Shamin
;
Jossart, Nico
;
Kar, Gouri Sankar
Journal
ELECTRONICS
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1786
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Downloads
217
since deposited on 2021-11-02
24
last month
8
last week
Acq. date: 2025-12-15
Views
1786
since deposited on 2021-11-02
3
last month
Acq. date: 2025-12-15
Citations