Publication:

A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications

Date

2021
Journal article
https://doi.org/10.3390/electronics10192384
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dc.contributor.authorRao, Siddharth
dc.contributor.authorCouet, Sebastien
dc.contributor.authorVan Beek, Simon
dc.contributor.authorKundu, Shreya
dc.contributor.authorHoushmand Sharifi, Shamin
dc.contributor.authorJossart, Nico
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorSharifi, Shamin Houshmand
dc.contributor.imecauthorJossart, Nico
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorHoushmand Sharifi, Shamin
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.date.accessioned2022-02-08T11:16:05Z
dc.date.available2021-11-02T15:55:16Z
dc.date.available2022-02-08T11:16:05Z
dc.date.issued2021
dc.identifier.doi10.3390/electronics10192384
dc.identifier.issn2079-9292
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37441
dc.publisherMDPI
dc.source.beginpage2384
dc.source.issue19
dc.source.journalELECTRONICS
dc.source.numberofpages11
dc.source.volume10
dc.title

A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications

dc.typeJournal article
dspace.entity.typePublication
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