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Conference contributions
Development of a Cu and W compatible PERR clean in BEOL advanced interconnect patterning
Publication:
Development of a Cu and W compatible PERR clean in BEOL advanced interconnect patterning
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Date
2015
Proceedings Paper
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31858.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kesters, Els
;
Le, Quoc Toan
;
Decoster, Stefan
;
Vega Gonzalez, Victor
;
Holsteyns, Frank
;
De Gendt, Stefan
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1932
since deposited on 2021-10-22
Acq. date: 2026-01-09
Citations
Metrics
Views
1932
since deposited on 2021-10-22
Acq. date: 2026-01-09
Citations