Publication:
Lattice defects in high quality as-grown CZ silicon, studied with light scattering and preferential etching techniques
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2028 since deposited on 2021-09-29
3last month
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Acq. date: 2026-01-25
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Statistics
Views
2028 since deposited on 2021-09-29
3last month
1last week
Acq. date: 2026-01-25
Citations