Publication:
Lattice defects in high quality as-grown CZ silicon, studied with light scattering and preferential etching techniques
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
2022 since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2022 since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations