Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Influence of fin width and channel length on the performance of buffers implemented with standard and strained triple-gate nFinFETs
Publication:
Influence of fin width and channel length on the performance of buffers implemented with standard and strained triple-gate nFinFETs
Copy permalink
Date
2009
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
19271.pdf
282.56 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pavanello, M.A.
;
Martino, J.A.
;
Simoen, Eddy
;
Rooyackers, Rita
;
Collaert, Nadine
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1810
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations
Metrics
Views
1810
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations