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Influence of fin width and channel length on the performance of buffers implemented with standard and strained triple-gate nFinFETs

Date

2009
Proceedings Paper
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dc.contributor.authorPavanello, M.A.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-18T01:35:38Z
dc.date.available2021-10-18T01:35:38Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15998
dc.source.beginpage567
dc.source.conference24th Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate31/08/2009
dc.source.conferencelocationNatal Brazil
dc.source.endpage574
dc.title

Influence of fin width and channel length on the performance of buffers implemented with standard and strained triple-gate nFinFETs

dc.typeProceedings paper
dspace.entity.typePublication
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