Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Metrology method for the correlation of line edge roughness for different resists before and after etch
Publication:
Metrology method for the correlation of line edge roughness for different resists before and after etch
Copy permalink
Date
2000
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Winkelmeier, Stephanie
;
Sarstedt, Margit
;
Ercken, Monique
;
Goethals, Mieke
;
Ronse, Kurt
Journal
Abstract
Description
Metrics
Views
1936
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1936
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-13
Citations