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Enabling Non-Actinic EUV Mask Inspection using CNT Pellicle
Publication:
Enabling Non-Actinic EUV Mask Inspection using CNT Pellicle
Date
2021
Proceedings Paper
https://doi.org/10.1117/12.2584695
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Keshet, Mor
;
Gershon, Dor
;
Malul, Uriel
;
Blinder, Yaniv
;
Orr, Yonatan
;
Tam, Aviram
;
Santoro, Gaetano
;
Houchens, Kevin
;
Gallagher, Emily
;
Timmermans, Marina
;
Frommhold, Andreas
;
Lorusso, Gian
Journal
Proceedings of SPIE
Abstract
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1824
since deposited on 2022-03-11
Acq. date: 2025-10-23
Citations
Metrics
Views
1824
since deposited on 2022-03-11
Acq. date: 2025-10-23
Citations