Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Electrical comparison of iN7 EUV hybrid and EUV single patterning BEOL metal layers
Publication:
Electrical comparison of iN7 EUV hybrid and EUV single patterning BEOL metal layers
Copy permalink
Date
2018
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
36921.pdf
1.45 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lariviere, Stephane
;
Wilson, Chris
;
Kutrzeba Kotowska, Bogumila
;
Versluijs, Janko
;
Decoster, Stefan
;
Mao, Ming
;
van der Veen, Marleen
;
Jourdan, Nicolas
;
El-Mekki, Zaid
;
Heylen, Nancy
;
Kesters, Els
;
Verdonck, Patrick
;
Beral, Christophe
;
Van Den Heuvel, Dieter
;
De Bisschop, Peter
;
Bekaert, Joost
;
Blanco, Victor
;
Ciofi, Ivan
;
Wan, Danny
;
Briggs, Basoene
;
Mallik, Arindam
;
Hendrickx, Eric
;
Kim, Ryan Ryoung han
;
McIntyre, Greg
;
Ronse, Kurt
;
Boemmels, Juergen
;
Tokei, Zsolt
;
Mocuta, Dan
Journal
Abstract
Description
Metrics
Views
1995
since deposited on 2021-10-25
Acq. date: 2025-12-11
Citations
Metrics
Views
1995
since deposited on 2021-10-25
Acq. date: 2025-12-11
Citations