Publication:

Modeling Microwave S-parameters using Frequency-scaled Rational Gaussian Process Kernels

 
dc.contributor.authorUllrick, Thijs
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorBogaerts, Wim
dc.contributor.authorDhaene, Tom
dc.contributor.imecauthorUllrick, Thijs
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecUllrick, Thijs::0000-0002-9587-6923
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.accessioned2025-06-10T13:17:40Z
dc.date.available2025-03-14T18:11:33Z
dc.date.available2025-03-17T12:52:56Z
dc.date.available2025-06-10T13:17:40Z
dc.date.embargo2024-11-21
dc.date.issued2024
dc.description.wosFundingTextThis work was supported by the 'Flemish Research Foundation (FWO-Vlaanderen) under grant G031421N' and 'Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen' programs.
dc.identifier.doi10.1109/EPEPS61853.2024.10754263
dc.identifier.eisbn979-8-3503-5123-1
dc.identifier.isbn979-8-3503-5124-8
dc.identifier.issn2165-4107
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45395
dc.publisherIEEE
dc.source.conference33rd Conference on Electrical Performance of Electronic Packaging and Systems
dc.source.conferencedateOCT 06-09, 2024
dc.source.conferencelocationToronto
dc.source.journalN/A
dc.source.numberofpages3
dc.title

Modeling Microwave S-parameters using Frequency-scaled Rational Gaussian Process Kernels

dc.typeProceedings paper
dspace.entity.typePublication
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