Extraction of the silicon film thickness on fully depleted SOI nMOSFETs using the black gate influence

Publication:

2000

Proceedings Paper

Author(s)

Nicolett, A. S.

;

Martino, Joao Antonio

;

;

Claeys, Cor

1963 since deposited on 2021-10-14

2last month

Acq. date: 2026-03-18