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Conference contributions
EUV resist contrast loss determination using interference lithography
Publication:
EUV resist contrast loss determination using interference lithography
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Langner, Andreas
;
Solak, Harun H.
;
Auzelyte, Vaida
;
Ekinci, Yasin
;
David, Christian
;
Gobrecht, Jens
;
Gronheid, Roel
;
van Setten, Eelco
;
van Ingen Schenau, Koen
;
Feenstra, Kees
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Acq. date: 2025-12-09
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1892
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-09
Citations