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Temperature and voltage dependences of the capture and emission times of individual traps in high-k dielectrics
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Temperature and voltage dependences of the capture and emission times of individual traps in high-k dielectrics
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Toledano Luque, Maria
;
Kaczer, Ben
;
Simoen, Eddy
;
Roussel, Philippe
;
Veloso, Anabela
;
Grasser, Tibor
;
Groeseneken, Guido
Journal
Microelectronic Engineering
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1823
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Acq. date: 2025-12-15
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Metrics
Views
1823
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-15
Citations