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Temperature and voltage dependences of the capture and emission times of individual traps in high-k dielectrics

Date

2011
Journal article
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dc.contributor.authorToledano Luque, Maria
dc.contributor.authorKaczer, Ben
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoussel, Philippe
dc.contributor.authorVeloso, Anabela
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-19T19:45:38Z
dc.date.available2021-10-19T19:45:38Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19900
dc.source.beginpage1243
dc.source.endpage1246
dc.source.issue7
dc.source.journalMicroelectronic Engineering
dc.source.volume88
dc.title

Temperature and voltage dependences of the capture and emission times of individual traps in high-k dielectrics

dc.typeJournal article
dspace.entity.typePublication
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