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Defect assessment control and engineering in advanced homo- and hetero-epitaxial device structures
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Defect assessment control and engineering in advanced homo- and hetero-epitaxial device structures
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Date
2011-04
Dissertation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
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Abstract
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1932
since deposited on 2021-10-19
Acq. date: 2026-01-11
Citations
Metrics
Views
1932
since deposited on 2021-10-19
Acq. date: 2026-01-11
Citations