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Characterizing grain size and defect energy distribution in vertical SONOS poly-Si channels by means of a resistive network model
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Characterizing grain size and defect energy distribution in vertical SONOS poly-Si channels by means of a resistive network model
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Toledano Luque, Maria
;
Arreghini, Antonio
;
Tang, Baojun
;
Capogreco, Elena
;
Lisoni, Judit
;
Roussel, Philippe
;
Kaczer, Ben
;
Van den Bosch, Geert
;
Groeseneken, Guido
;
Van Houdt, Jan
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1969
since deposited on 2021-10-21
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last week
Acq. date: 2025-12-10
Citations
Metrics
Views
1969
since deposited on 2021-10-21
2
last month
1
last week
Acq. date: 2025-12-10
Citations