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Electrical and physical characterization of high-k dielectric layers
Publication:
Electrical and physical characterization of high-k dielectric layers
Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Naili, Mohamed
;
Afanas'ev, V. V.
;
Heyns, Marc
;
Stesmans, Andre
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Abstract
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1885
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1885
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations