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Surfactinated rinse against pattern collapse and defectivity in 193 nm lithography
Publication:
Surfactinated rinse against pattern collapse and defectivity in 193 nm lithography
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Misat, Sylvain Irenee
;
Grozev, Grozdan
;
Versluijs, Janko
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1812
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Views
1812
since deposited on 2021-10-15
2
last month
Acq. date: 2025-12-15
Citations