Publication:

Performance improvement of tall triple gate devices with strained SiN layers

Date

2005-11

Journal article

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Author(s)

Collaert, Nadine

;

De Keersgieter, An

;

Kottantharayil, Anil

;

Rooyackers, Rita

;

;

Goodwin, Michael

;

Eyckens, Brenda

;

;

de Marneffe, Jean-Francois

;

De Meyer, Kristin

;

Absil, Philippe

;

;

Biesemans, Serge

Journal

IEEE Electron Device Letters

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1999 since deposited on 2021-10-16

Acq. date: 2026-04-26