Publication:
Mobility reduction due to remote charge scattering in Al2O3/SiO2 gate-stacked MISFETs
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1939 since deposited on 2021-10-14
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Acq. date: 2026-03-17
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Statistics
Views
1939 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-03-17
Citations