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Mobility reduction due to remote charge scattering in Al2O3/SiO2 gate-stacked MISFETs
Publication:
Mobility reduction due to remote charge scattering in Al2O3/SiO2 gate-stacked MISFETs
Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Saito, Shin-ichi
;
Shimamoto, Yasuhiro
;
Torii, Kazuyoshi
;
Manabe, Yukiko
;
Caymax, Matty
;
Maes, Jan
;
Hiratani, Masahiko
;
Kimura, Shin-ichiro
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1935
since deposited on 2021-10-14
412
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Acq. date: 2025-10-24
Citations
Metrics
Views
1935
since deposited on 2021-10-14
412
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations