TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

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Author(s)

Bonaldo, Stefano

;

Gorchichko, Mariia

;

;

;

Mattiazzo, Serena

;

;

Paccagnella, Alessandro

;

Gerardin, Simone

;

Schrimpf, Ronald D.

;

Reed, Robert A.

;

Linten, Dimitri

;

;

Fleetwood, Daniel M.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Metrics

1590 since deposited on 2022-07-31

Acq. date: 2025-10-23