Publication:
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
| dc.contributor.author | Bonaldo, Stefano | |
| dc.contributor.author | Gorchichko, Mariia | |
| dc.contributor.author | Zhang, En Xia | |
| dc.contributor.author | Ma, Teng | |
| dc.contributor.author | Mattiazzo, Serena | |
| dc.contributor.author | Bagatin, Marta | |
| dc.contributor.author | Paccagnella, Alessandro | |
| dc.contributor.author | Gerardin, Simone | |
| dc.contributor.author | Schrimpf, Ronald D. | |
| dc.contributor.author | Reed, Robert A. | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.author | Fleetwood, Daniel M. | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.date.accessioned | 2022-11-25T09:33:15Z | |
| dc.date.available | 2022-07-31T02:29:16Z | |
| dc.date.available | 2022-11-25T09:33:15Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work was supported in part by the Air Force Office of Scientific Research and in part by the Air Force Research Laboratory through the Hi-REV Program. | |
| dc.identifier.doi | 10.1109/TNS.2022.3142385 | |
| dc.identifier.issn | 0018-9499 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40187 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 1444 | |
| dc.source.endpage | 1452 | |
| dc.source.issue | 7 | |
| dc.source.journal | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 69 | |
| dc.subject.keywords | LOW-FREQUENCY NOISE | |
| dc.subject.keywords | 1/F NOISE | |
| dc.subject.keywords | IONIZING-RADIATION | |
| dc.subject.keywords | INTERFACE STATES | |
| dc.subject.keywords | INGAAS FINFETS | |
| dc.subject.keywords | BORDER TRAPS | |
| dc.subject.keywords | X-RAY | |
| dc.subject.keywords | BIAS DEPENDENCE | |
| dc.subject.keywords | MOS | |
| dc.subject.keywords | BULK | |
| dc.title | TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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