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Conference contributions
Metrology for implanted Si substrate and dopant loss studies
Publication:
Metrology for implanted Si substrate and dopant loss studies
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Radisic, Dunja
;
Shamiryan, Denis
;
Mannaert, Geert
;
Boullart, Werner
;
Rosseel, Erik
;
Bogdanowicz, Janusz
;
Goossens, Jozefien
;
Marrant, Koen
;
Bender, Hugo
;
Sonnemans, Roger
;
Berry, Ivan
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1919
since deposited on 2021-10-18
Acq. date: 2025-12-11
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Downloads
1
since deposited on 2021-10-18
Acq. date: 2025-12-11
Views
1919
since deposited on 2021-10-18
Acq. date: 2025-12-11
Citations