Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators
Publication:
Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators
Date
2012
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
23312.pdf
748.57 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martin-Martinez, Javier
;
Kaczer, Ben
;
Degraeve, Robin
;
Roussel, Philippe
;
Rodriguez, Rosana
;
Nafria, Monserrat
;
Aymerich, X.
;
Dierickx, Bart
;
Groeseneken, Guido
Journal
IEEE Transactions on Device and Materials Reliability
Abstract
Description
Metrics
Views
1887
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1887
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-08
Citations