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A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation
Publication:
A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation
Date
2019-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Arimura, Hiroaki
;
Cott, Daire
;
Boccardi, Guillaume
;
Loo, Roger
;
Wostyn, Kurt
;
Brus, Stephan
;
Capogreco, Elena
;
Opdebeeck, Ann
;
Witters, Liesbeth
;
Conard, Thierry
;
Suhard, Samuel
;
van Dorp, Dennis
;
Kenis, Karine
;
Ragnarsson, Lars-Ake
;
Mitard, Jerome
;
Holsteyns, Frank
;
De Heyn, Vincent
;
Mocuta, Dan
;
Collaert, Nadine
;
Horiguchi, Naoto
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2002
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
2002
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations