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Accurate prediction of device performance in sub-10nm WFIN FinFETs using scalpel SSRM-based calibration of process simulations
Publication:
Accurate prediction of device performance in sub-10nm WFIN FinFETs using scalpel SSRM-based calibration of process simulations
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eyben, Pierre
;
Matagne, Philippe
;
Chiarella, Thomas
;
De Keersgieter, An
;
Kubicek, Stefan
;
Mitard, Jerome
;
Mocuta, Anda
;
Horiguchi, Naoto
;
Thean, Aaron
;
Mocuta, Dan
Journal
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1911
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1911
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations