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Evaluation of UBM oxidation through air exposure and heating and effectiveness of wet and plasma cleaning on solder joint formation during TCB

 
dc.contributor.authorMirdamadi, S. Hossein
dc.contributor.authorDerakhshandeh, Jaber
dc.contributor.authorCochet, Tom
dc.contributor.authorBeyne, Eric
dc.contributor.authorBeyer, Gerald
dc.contributor.authorMiller, Andy
dc.contributor.authormirda
dc.contributor.imecauthorMirdamadi, S. Hossein
dc.contributor.imecauthorDerakhshandeh, Jaber
dc.contributor.imecauthorCochet, Tom
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.imecauthorMiller, Andy
dc.contributor.orcidimecDerakhshandeh, Jaber::0000-0003-2448-9165
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.accessioned2022-01-27T09:50:34Z
dc.date.available2021-11-02T16:03:16Z
dc.date.available2022-01-27T09:50:34Z
dc.date.issued2020
dc.identifier.doi10.1109/ESTC48849.2020.9229662
dc.identifier.eisbn978-1-7281-6293-5
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38043
dc.publisherIEEE
dc.source.conference8th IEEE Electronics System-Integration Technology Conference (ESTC)
dc.source.conferencedateSEP 15-18, 2020
dc.source.conferencelocationVestfold
dc.source.journalna
dc.source.numberofpages8
dc.title

Evaluation of UBM oxidation through air exposure and heating and effectiveness of wet and plasma cleaning on solder joint formation during TCB

dc.typeProceedings paper
dspace.entity.typePublication
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