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Micro-bridge defects: characterization and root cause analysis
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Micro-bridge defects: characterization and root cause analysis
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Date
2010
Proceedings Paper
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20413.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Santoro, Gaetano
;
Van Den Heuvel, Dieter
;
Braggin, Jennifer
;
Rosslee, Craig
;
Leray, Philippe
;
Cheng, Shaunee
;
Jehoul, Christiane
;
Schreutelkamp, Rob
;
Hillel, Noam
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Acq. date: 2025-12-11
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Views
1908
since deposited on 2021-10-18
2
last month
2
last week
Acq. date: 2025-12-11
Citations