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Local potential measurements in silicon devices using atomic force microscopy with conductive tips
Publication:
Local potential measurements in silicon devices using atomic force microscopy with conductive tips
Date
1995
Proceedings Paper
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893.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Trenkler, Thomas
;
De Wolf, Peter
;
Snauwaerts, Jan
;
Qamhieh, Z.
;
Vandervorst, Wilfried
;
Hellemans, L.
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1994
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations
Metrics
Views
1994
since deposited on 2021-09-29
Acq. date: 2025-10-24
Citations