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Characterization of annealing and dopant activation processes using Differential Hall Effect Metrology (DHEM)
Publication:
Characterization of annealing and dopant activation processes using Differential Hall Effect Metrology (DHEM)
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Date
2021
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Joshi, Abhijeet
;
Rengo, Gianluca
;
Porret, Clément
;
Lin, Kun-Lin
;
Chang, C-H.
;
Basol, Bulent
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1903
since deposited on 2021-10-31
4
last month
Acq. date: 2025-12-16
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Metrics
Views
1903
since deposited on 2021-10-31
4
last month
Acq. date: 2025-12-16
Citations