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Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes
Publication:
Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vinicius de Oliveira, Alberto
;
Simoen, Eddy
;
Ghedini der Agopian, Paula
;
Martino, Joao Antonio
;
Witters, Liesbeth
;
Collaert, Nadine
;
Thean, Aaron
;
Claeys, Cor
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1850
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations
Metrics
Views
1850
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations