Publication:

Perovskite Metal-Oxide-Semiconductor Structures for Interface Characterization

Date

2021
Journal article
https://doi.org/10.1002/admi.202101004
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dc.contributor.authorCunha, Jose M. V.
dc.contributor.authorBarreiros, M. Alexandra
dc.contributor.authorCurado, Marco A.
dc.contributor.authorOliveira, Kevin
dc.contributor.authorOliveira, Antonio J. N.
dc.contributor.authorBarbosa, Joao R. S.
dc.contributor.authorVilanova, Antonio
dc.contributor.authorBrites, Maria Joao
dc.contributor.authorMascarenhas, Joao
dc.contributor.authorFlandre, Denis
dc.contributor.authorSilva, Ana G.
dc.contributor.authorFernandes, Paulo A.
dc.contributor.authorSalome, Pedro M. P.
dc.contributor.authorSousa Lopes, Tomas
dc.contributor.imecauthorSousa Lopes, Tomas
dc.contributor.orcidextCunha, Jose M. V.::0000-0002-1622-0193
dc.contributor.orcidextBarreiros, M. Alexandra::0000-0002-0132-4969
dc.contributor.orcidimecSousa Lopes, Tomas::0000-0002-1266-386X
dc.date.accessioned2021-11-25T13:14:12Z
dc.date.available2021-11-02T15:56:46Z
dc.date.available2021-11-25T13:14:12Z
dc.date.embargo2023-02-22
dc.date.issued2021
dc.identifier.doi10.1002/admi.202101004
dc.identifier.issn2196-7350
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37543
dc.publisherWILEY
dc.source.issue20
dc.source.journalADVANCED MATERIALS INTERFACES
dc.source.numberofpages12
dc.source.volume8
dc.subject.keywordsPROCESSED TIN OXIDE
dc.subject.keywordsSOLAR-CELLS
dc.subject.keywordsSURFACE PASSIVATION
dc.subject.keywordsHALIDE PEROVSKITES
dc.subject.keywordsTHIN-FILM
dc.subject.keywordsLAYER
dc.subject.keywordsTEMPERATURE
dc.subject.keywordsTRANSPORT
dc.subject.keywordsPERFORMANCE
dc.subject.keywordsDEPOSITION
dc.title

Perovskite Metal-Oxide-Semiconductor Structures for Interface Characterization

dc.typeJournal article
dspace.entity.typePublication
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