Publication:

The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices

Date

2015
Proceedings Paper
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Author(s)

Vais, Abhitosh  
;
Martens, Koen  
;
Franco, Jacopo  
;
Lin, Dennis  
;
Alian, AliReza  
;
Roussel, Philippe  
;
Sioncke, Sonja
;
Collaert, Nadine  
;
Thean, Aaron  
;
Heyns, Marc  
;
Groeseneken, Guido  
;
De Meyer, Kristin  

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