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A novel resist and post-etch residue removal process using ozonated chemistry
Publication:
A novel resist and post-etch residue removal process using ozonated chemistry
Date
1998
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Gendt, Stefan
;
Snee, Peter
;
Cornelissen, Ingrid
;
Lux, Marcel
;
Vos, Rita
;
Mertens, Paul
;
Knotter, Martin
;
Meuris, Marc
;
Heyns, Marc
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2057
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
2057
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-08
Citations