Vertical GaN devices: Process and reliability

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Author(s)

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Heuken, Michael

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Mukherjee, Kalparupa

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De Santi, Carlo

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Meneghini, Matteo

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Kumar, Ashutosh

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Bjork, Mikael T.

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Ohlsson, B. Jonas

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Decoutere, Stefaan

Journal

MICROELECTRONICS RELIABILITY

Metrics

1851 since deposited on 2022-01-08

Acq. date: 2025-10-23