Publication:

Vertical GaN devices: Process and reliability

Date

2021
Journal article
https://doi.org/10.1016/j.microrel.2021.114218
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dc.contributor.authorYou, Shuzhen
dc.contributor.authorGeens, Karen
dc.contributor.authorBorga, Matteo
dc.contributor.authorLiang, Hu
dc.contributor.authorHahn, Herwig
dc.contributor.authorFahle, Dirk
dc.contributor.authorHeuken, Michael
dc.contributor.authorMukherjee, Kalparupa
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorZanoni, Enrico
dc.contributor.authorBerg, Martin
dc.contributor.authorRamvall, Peter
dc.contributor.authorKumar, Ashutosh
dc.contributor.authorBjork, Mikael T.
dc.contributor.authorOhlsson, B. Jonas
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2022-01-26T11:54:07Z
dc.date.available2022-01-08T02:05:06Z
dc.date.available2022-01-26T11:54:07Z
dc.date.issued2021
dc.identifier.doi10.1016/j.microrel.2021.114218
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38725
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.issuena
dc.source.journalMICROELECTRONICS RELIABILITY
dc.source.numberofpages6
dc.source.volume126
dc.subject.keywordsN-DIODES
dc.title

Vertical GaN devices: Process and reliability

dc.typeJournal article
dspace.entity.typePublication
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