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Ab initio modeling of oxygen-vacancy formation in doped-HfOx RRAM: effects of oxide phases, stoichiometry and dopant concentrations
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Acq. date: 2026-04-06
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Acq. date: 2026-04-06
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1 since deposited on 2021-10-22
Acq. date: 2026-04-06
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1962 since deposited on 2021-10-22
1last month
Acq. date: 2026-04-06
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