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Articles
A multilevel sub-modeling approach to evaluate 3D IC packaging induced stress on hybrid interconnect structures
Publication:
A multilevel sub-modeling approach to evaluate 3D IC packaging induced stress on hybrid interconnect structures
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lofrano, Melina
;
Gonzalez, Mario
;
Vandevelde, Bart
Journal
Microelectronic Engineering
Abstract
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1874
since deposited on 2021-10-22
Acq. date: 2025-12-16
Citations
Metrics
Views
1874
since deposited on 2021-10-22
Acq. date: 2025-12-16
Citations