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Dielectric reliability of 50nm 1/2 pitch structures in Aurora® LK
Publication:
Dielectric reliability of 50nm 1/2 pitch structures in Aurora® LK
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Demuynck, Steven
;
Kim, Hongun
;
Huffman, Craig
;
Darnon, Maxime
;
Struyf, Herbert
;
Versluijs, Janko
;
Claes, Martine
;
Vereecke, Guy
;
Volders, Henny
;
Heylen, Nancy
;
Kellens, Kristof
;
Beyer, Gerald
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1926
since deposited on 2021-10-17
421
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1926
since deposited on 2021-10-17
421
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations