Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
Publication:
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
Copy permalink
Date
2001
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Gryse, O.
;
Clauws, P.
;
Lebedev, O.
;
Van Landuyt, J.
;
Vanhellemont, Jan
;
Claeys, C.
;
Simoen, Eddy
Journal
Physica B
Abstract
Description
Metrics
Views
1958
since deposited on 2021-10-14
Acq. date: 2026-01-05
Citations
Metrics
Views
1958
since deposited on 2021-10-14
Acq. date: 2026-01-05
Citations