Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
EUV photoresist patterning characterization for imec N7/N5 technology
Publication:
EUV photoresist patterning characterization for imec N7/N5 technology
Date
2018
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
40152.pdf
1.96 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Simone, Danilo
;
Rutigliani, Vito
;
Lorusso, Gian
;
De Bisschop, Peter
;
Vesters, Yannick
;
Blanco, Victor
;
Vandenberghe, Geert
Journal
Abstract
Description
Metrics
Views
1953
since deposited on 2021-10-25
Acq. date: 2025-10-24
Citations
Metrics
Views
1953
since deposited on 2021-10-25
Acq. date: 2025-10-24
Citations