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Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
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Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
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Date
2012-07
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schulze, Andreas
;
Hantschel, Thomas
;
Dathe, Andre
;
Eyben, Pierre
;
Ke, Xiaoxing
;
Vandervorst, Wilfried
Journal
Nanotechnology
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1847
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Acq. date: 2025-12-12
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Metrics
Views
1847
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-12
Citations